Analysis apparatus, analysis method, and program

专利名称：Analysis apparatus, analysis method, and

program

发明人：加藤 博司申请号：JP2018113073申请日：20180613公开号：JP2019215750A公开日：20191219

专利附图：

摘要：An analysis apparatus, an analysis method, and a program capable of efficientlydesigning a device are provided. An analysis device includes: an acquisition unit thatacquires an analysis result analyzed by an analysis model that analyzes a target event

using a plurality of parameters; and an analysis result acquired by the acquisition unit by aBayesian optimization technique. Based on, evaluating the combination of the plurality ofparameters when the target event is analyzed by the analysis model, based on theevaluation result for each of the evaluated combination of the plurality of parameters, Anoptimization processing unit that determines a combination of parameters of the analysismodel from among the combinations. [Selection] Figure 1

申请人：国立研究開発法人宇宙航空研究開発機構

地址：東京都調布市深大寺東町七丁目４４番地１

国籍：JP

代理人：棚井 澄雄,橋本 宏之,山口 洋,沖田 壮男,荒 則彦

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