Methods, devices and kits for peri-critical reflec

专利名称：Methods, devices and kits for peri-critical

reflectance spectroscopy

发明人：Robert G. Messerchmidt申请号：US12865698申请日：20090130公开号：US08730468B2公开日：20140520

专利附图：

摘要：Spectroscopy apparatuses oriented to the critical angle of the sample aredescribed that detect the spectral characteristics of a sample. The apparatus includes anelectromagnetic radiation source adapted to excite a sample with electromagnetic

radiation introduced to a measurement site of the sample at a plurality of angles ofincidence near a critical angle of the sample and a transmitting crystal in communicationwith the electromagnetic radiation source and the sample. The transmitting crystal mayhave a high refractive index adapted to reflect the electromagnetic radiation internally.The apparatus includes a reflector adapted to introduce the electromagnetic radiation toa measurement site of the sample at a plurality of angles of incidence near the criticalangle between the transmitting crystal and sample. The apparatus includes a detectorfor detecting the electromagnetic radiation from the sample. Also, provided herein aremethods, systems, and kits incorporating the peri-critical reflectance spectroscopyapparatus.

申请人：Robert G. Messerchmidt

地址：Los Altos CA US

国籍：US

代理机构：Schwegman Lundberg & Woessner, P.A.

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